Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7710565 | Method of correcting systematic error in a metrology system | Sanjeev Kaushal, Kenji Sugishima | 2010-05-04 |
| 7561269 | Optical measurement system with systematic error correction | Sanjeev Kaushal, Kenji Sugishima | 2009-07-14 |