NK

Noriaki Koyama

TL Tokyo Electron Limited: 12 patents #586 of 5,567Top 15%
KT Kabushiki Kaisha Toshiba: 4 patents #6,684 of 21,451Top 35%
Toshiba Memory: 1 patents #1,210 of 1,971Top 65%
📍 Yokkaichi, JP: #233 of 2,072 inventorsTop 15%
Overall (All Time): #269,707 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDate
11822319 Semiconductor system Kazushi Shoji, Motokatsu Miyazaki 2023-11-21
11567485 Substrate processing system and method for monitoring process data Nobutoshi TERASAWA, Tomonori Yamashita, Takazumi Tanaka, Takehiro KINOSHITA, Fumiaki NAGAI +1 more 2023-01-31
10734291 Abnormality detection apparatus Kazushi Shoji, Motokatsu Miyazaki 2020-08-04
10199386 Semiconductor memory device and method for manufacturing same Takashi Terada, Hisashi Kato 2019-02-05
9703284 Group management system and recording medium 2017-07-11
8355808 Server device of group management system having function of performing fault detection and program Takumi Inokawa 2013-01-15
8327398 Apparatus, computer program product, and method for data distribution Miwako Doi, Tetsuro Muranaga, Tetsuya Gotou, Hideki Tsutsui 2012-12-04
8190283 Server and program Takumi Inokawa 2012-05-29
8121799 Life estimating method for heater wire, heating apparatus, storage medium, and life estimating system for heater wire Nobutoshi TERASAWA, Minoru Obata 2012-02-21
8055391 Server device and program Masashi Takahashi, Minoru Obata 2011-11-08
7974729 Server device and program with sub-recipe measurement communication Masashi Takahashi, Minoru Obata 2011-07-05
7896649 Heat system, heat method, and program Wenling Wang 2011-03-01
7869888 Information processing apparatus, semiconductor manufacturing system, information processing method, and storage medium Minoru Obata, Wenling Wang 2011-01-11
7814144 Recommending system, recommending server, content recommending method, and recommending program product Tetsuya Gotou 2010-10-12
7751921 Semiconductor manufacturing apparatus, method of detecting abnormality, identifying cause of abnormality, or predicting abnormality in the semiconductor manufacturing apparatus, and storage medium storing computer program for performing the method Koichi Sakamoto, Minoru Obata 2010-07-06
6131109 Multitask processor, a multitask processing method, a multitask processing display method and a storage medium for processing by correlating task and object Katsuhiko Ueki, Masato Igarashi, Takeshi Yasuda, Masaaki Okajima, Ikuya Odahara 2000-10-10
5845125 Debugger using class information and dynamic instance inter-relationships Tomoko Nishimura, Masato Igarashi, Katsuhiko Ueki 1998-12-01