AN

Adam E. Norton

TL Tokyo Electron Limited: 15 patents #423 of 5,567Top 8%
XD X Development: 9 patents #83 of 653Top 15%
TH Therma-Wave: 7 patents #15 of 60Top 25%
KL Kla-Tencor: 6 patents #301 of 1,394Top 25%
Google: 6 patents #4,394 of 22,993Top 20%
SI Sensys Instruments: 3 patents #4 of 13Top 35%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
PR Prometrix: 1 patents #9 of 21Top 45%
BE Bodkin Design And Engineering: 1 patents #4 of 5Top 80%
📍 Palo Alto, CA: #361 of 9,675 inventorsTop 4%
🗺 California: #7,669 of 386,348 inventorsTop 2%
Overall (All Time): #52,802 of 4,157,543Top 2%
51
Patents All Time

Issued Patents All Time

Showing 51–51 of 51 patents

Patent #TitleCo-InventorsDate
5486701 Method and apparatus for measuring reflectance in two wavelength bands to enable determination of thin film thickness Hung Pham 1996-01-23