Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12308275 | Heterogeneous integration of components onto compact devices using moiré based metrology and vacuum based pick-and-place | Sidlgata V. Sreenivasan, Paras Ajay, Aseem Sayal, Mark W. McDermott, Shrawan Singhal +3 more | 2025-05-20 |
| 12009247 | Heterogeneous integration of components onto compact devices using moiré based metrology and vacuum based pick-and-place | Sidlgata V. Sreenivasan, Paras Ajay, Aseem Sayal, Mark W. McDermott, Shrawan Singhal +3 more | 2024-06-11 |
| 11469131 | Heterogeneous integration of components onto compact devices using moire based metrology and vacuum based pick-and-place | Sidlgata V. Sreenivasan, Paras Ajay, Aseem Sayal, Mark W. McDermott, Shrawan Singhal +3 more | 2022-10-11 |
| 11228294 | Graphene microelectromechanical system (MEMS) resonant gas sensor | Joon CHO, David CAYLL, Ian Seth Ladner | 2022-01-18 |
| 10722947 | Micro-selective sintering laser systems and methods thereof | Nilabh K. Roy, Anil Yuksel, Chee Seng Foong | 2020-07-28 |
| 10712364 | Metrology devices for rapid specimen setup | Tsung-Fu Yao, Andrew C. Duenner | 2020-07-14 |
| 10649003 | Coupled multiscale positioning of arrays of parallel, independently actuated and simultaneously driven modular scanning probe microscopes for high-throughput, in-line, nanoscale measurement of flexible, large area, and roll-to-roll processes | Liam Glazer Connolly | 2020-05-12 |
| 10451539 | Microscale sensors for direct metrology of additively manufactured features | Sourabh Kumar Saha, Robert Matthew Panas, Ian Seth Ladner | 2019-10-22 |