Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12424498 | System and method for modification of substrates | Sidlgata V. Sreenivasan, Lawrence R. Dunn | 2025-09-23 |
| 12308275 | Heterogeneous integration of components onto compact devices using moiré based metrology and vacuum based pick-and-place | Sidlgata V. Sreenivasan, Paras Ajay, Aseem Sayal, Mark W. McDermott, Ovadia Abed +3 more | 2025-05-20 |
| 12168244 | Nanoscale thin film deposition systems | Sidlgata V. Sreenivasan, Parth Pandya, David Choi, Lawrence R. Dunn | 2024-12-17 |
| 12094775 | Nanoscale-aligned three-dimensional stacked integrated circuit | Sidlgata V. Sreenivasan, Paras Ajay, Aseem Sayal, Ovadia Abed, Mark W. McDermott +1 more | 2024-09-17 |
| 12009247 | Heterogeneous integration of components onto compact devices using moiré based metrology and vacuum based pick-and-place | Sidlgata V. Sreenivasan, Paras Ajay, Aseem Sayal, Mark W. McDermott, Ovadia Abed +3 more | 2024-06-11 |
| 11762284 | Wafer-scale programmable films for semiconductor planarization and for imprint lithography | Sidlgata V. Sreenivasan, Ovadia Abed, Lawrence R. Dunn | 2023-09-19 |
| 11669009 | Roll-to-roll programmable film imprint lithography | Sidlgata V. Sreenivasan, Ovadia Abed, Lawrence R. Dunn, Paras Ajay, Ofodike A. Ezekoye | 2023-06-06 |
| 11600525 | Nanoscale-aligned three-dimensional stacked integrated circuit | Sidlgata V. Sreenivasan, Paras Ajay, Aseem Sayal, Ovadia Abed, Mark W. McDermott +1 more | 2023-03-07 |
| 11469131 | Heterogeneous integration of components onto compact devices using moire based metrology and vacuum based pick-and-place | Sidlgata V. Sreenivasan, Paras Ajay, Aseem Sayal, Mark W. McDermott, Ovadia Abed +3 more | 2022-10-11 |
| 10816482 | High throughput, high resolution optical metrology for reflective and transmissive nanophotonic devices | S. Sreenivasan, Brian Gawlik | 2020-10-27 |
| 10717646 | Precision alignment of the substrate coordinate system relative to the inkjet coordinate system | Sidlgata V. Sreenivasan | 2020-07-21 |
| 10336062 | Systems and methods for precision inkjet printing | S. Sreenivasan, Brent Snyder, Miaomiao Yang, Ovadia Abed | 2019-07-02 |
| 10026609 | Nanoshape patterning techniques that allow high-speed and low-cost fabrication of nanoshape structures | Sidlgata V. Sreenivasan, Anshuman Cherala, Meghali Chopra, Roger T. Bonnecaze, Ovadia Abed +3 more | 2018-07-17 |
| 9987653 | Versatile process for precision nanoscale manufacturing | Sidlgata V. Sreenivasan | 2018-06-05 |
| 9718096 | Programmable deposition of thin films of a user-defined profile with nanometer scale accuracy | Sidlgata V. Sreenivasan, Ovadia Abed, Lawrence R. Dunn | 2017-08-01 |
| 9415418 | Programmable deposition of thin films of a user-defined profile with nanometer scale accuracy | Sidlgata V. Sreenivasan | 2016-08-16 |
| 8187515 | Large area roll-to-roll imprint lithography | Sidlgata V. Sreenivasan, Byung-Jin Choi, Ian McMackin | 2012-05-29 |
| 7815824 | Real time imprint process diagnostics for defects | Sidlgata V. Sreenivasan, Byung-Jin Choi | 2010-10-19 |