Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5488613 | Scan test circuits for use with multiple frequency circuits | — | 1996-01-30 |
| 5059897 | Method and apparatus for testing passive substrates for integrated circuit mounting | Thomas J. Aton, Satwinder Malhi, Masashi Hashimoto, Shivaling S. Mahant-Shitti, Oh-Kyong Kwon | 1991-10-22 |
| 4601034 | Method and apparatus for testing very large scale integrated memory circuits | — | 1986-07-15 |
| 4597080 | Architecture and method for testing VLSI processors | Satish M. Thatte, David Ho, Han-Tzong Yuan, Theo J. Powell | 1986-06-24 |