Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7328388 | Built-in self-test arrangement for integrated circuit memory devices | Danny R. Cline, Theo J. Powell | 2008-02-05 |
| 7278078 | Built-in self-test arrangement for integrated circuit memory devices | Danny R. Cline, Theo J. Powell | 2007-10-02 |
| 6801461 | Built-in self-test arrangement for integrated circuit memory devices | Danny R. Cline, Theo J. Powell | 2004-10-05 |
| 6353563 | Built-in self-test arrangement for integrated circuit memory devices | Danny R. Cline, Theo J. Powell | 2002-03-05 |
| 6014336 | Test enable control for built-in self-test | Theo J. Powell, Danny R. Cline | 2000-01-11 |
| 5991213 | Short disturb test algorithm for built-in self-test | Danny R. Cline, James M. Garnett, Siak Kian Lee, Tek Yong Lim, Keat Peng Lee | 1999-11-23 |
| 5959912 | ROM embedded mask release number for built-in self-test | Theo J. Powell, Danny R. Cline, Wah Kit Loh | 1999-09-28 |
| 5953272 | Data invert jump instruction test for built-in self-test | Theo J. Powell, Danny R. Cline | 1999-09-14 |
| 5936900 | Integrated circuit memory device having built-in self test circuit with monitor and tester modes | Theo J. Powell, Daniel R. Cline | 1999-08-10 |
| 5923599 | Apparatus and method for subarray testing in dynamic random access memories using a built-in-self-test unit | Danny R. Cline, Theo J. Powell, Wah Kit Loh | 1999-07-13 |
| 5883843 | Built-in self-test arrangement for integrated circuit memory devices | Danny R. Cline, Theo J. Powell | 1999-03-16 |
| 5875153 | Internal/external clock option for built-in self test | Theo J. Powell, Danny R. Cline | 1999-02-23 |