JG

James M. Garnett

TI Texas Instruments: 1 patents #7,357 of 12,488Top 60%
Overall (All Time): #3,668,795 of 4,157,543Top 90%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
5991213 Short disturb test algorithm for built-in self-test Danny R. Cline, Kuong Hua Hii, Siak Kian Lee, Tek Yong Lim, Keat Peng Lee 1999-11-23