Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7598759 | Routing engine, method of routing a test probe and testing system employing the same | Rex W. Pirkle, Sean Michael Malolepszy, Michael W. Perry | 2009-10-06 |
| 6872582 | Selective trim and wafer testing of integrated circuits | Rex W. Pirkle, Curtis L. Harbert | 2005-03-29 |
| 6834246 | Multiprobe blob test in lieu of 100% probe test | Todd Stubblefield, Eugene Gharis | 2004-12-21 |
| 6718227 | System and method for determining a position error in a wafer handling device | Floyd Schemmel, Troy W. Hoehner | 2004-04-06 |