Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6895109 | Apparatus and method for automatically detecting defects on silicon dies on silicon wafers | Richard L. Thorne | 2005-05-17 |
| 6718227 | System and method for determining a position error in a wafer handling device | George Reeves, Troy W. Hoehner | 2004-04-06 |
| 6504948 | Apparatus and method for automatically detecting defects on silicon dies on silicon wafers | Richard L. Thorne | 2003-01-07 |
| 6175646 | Apparatus for detecting defective integrated circuit dies in wafer form | Richard L. Thorne | 2001-01-16 |
| 5943551 | Apparatus and method for detecting defects on silicon dies on a silicon wafer | Richard L. Thorne | 1999-08-24 |
| 4973903 | Adjustable probe for probe assembly | — | 1990-11-27 |