Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6378109 | Method of simulation for gate oxide integrity check on an entire IC | Franciso A. Cano, Nagaraj Savithri | 2002-04-23 |
| 6038383 | Method and apparatus for determining signal line interconnect widths to ensure electromigration reliability | Francisco A. Cano, Nagaraj Savithri, Haldun Haznedar | 2000-03-14 |