DW

David D. Wilmoth

TI Texas Instruments: 11 patents #1,283 of 12,488Top 15%
Micron: 5 patents #2,350 of 6,345Top 40%
EC Ecmd: 1 patents #3 of 8Top 40%
EB E.D. Bullard: 1 patents #23 of 35Top 70%
Overall (All Time): #252,696 of 4,157,543Top 7%
18
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
D962160 Battery charger for a thermal imager Alain Laurent, Jonathan Price, David A. Ward 2022-08-30
11327113 Memory loopback systems and methods 2022-05-10
10991404 Loopback strobe for a memory system 2021-04-27
10393803 Memory loopback systems and methods 2019-08-27
10360959 Adjusting instruction delays to the latch path in DDR5 DRAM Jason M. Brown 2019-07-23
10176858 Adjusting instruction delays to the latch path in DDR5 DRAM Jason M. Brown 2019-01-08
8562280 Warehouse storage system Scott Kilby, Jeremiah Kerley 2013-10-22
5488317 Wired logic functions on FPGA's William S. Webster 1996-01-30
5485105 Apparatus and method for programming field programmable arrays Mark G. Harward 1996-01-16
5399923 Field programmable gate array device with antifuse overcurrent protection William S. Webster 1995-03-21
5243490 ESD protected FAMOS transistor George S. Ontko 1993-09-07
5045489 Method of making a high-speed 2-transistor cell for programmable/EEPROM devices with separate read and write transistors Manzur Gill 1991-09-03
4963765 High speed CMOS transition detector circuit Shailesh R. Kadakia 1990-10-16
4924437 Erasable programmable memory including buried diffusion source/drain lines and erase lines James L. Paterson, Bert R. Riemenschneider 1990-05-08
4868790 Reference circuit for integrated memory arrays having virtual ground connections Tim M. Coffman, John F. Schreck, Jeffrey K. Kaszubinski 1989-09-19
4797857 Array discharge for biased array John F. Schreck, Timmie M. Coffman 1989-01-10
4740925 Extra row for testing programmability and speed of ROMS Jeffrey K. Kaszubinski, Timmie M. Coffman, John F. Schreck 1988-04-26
4722075 Equalized biased array for PROMS and EPROMS Jeffrey K. Kaszubinski, Timmie M. Coffman, John F. Schreck 1988-01-26