Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11775320 | Overflow detection and correction in state machine engines | — | 2023-10-03 |
| 11016790 | Overflow detection and correction in state machine engines | — | 2021-05-25 |
| 10929154 | Overflow detection and correction in state machine engines | — | 2021-02-23 |
| 9703574 | Overflow detection and correction in state machine engines | — | 2017-07-11 |
| 6778453 | METHOD OF STORING A TEMPERATURE THRESHOLD IN AN INTEGRATED CIRCUIT, METHOD OF MODIFYING OPERATION OF DYNAMIC RANDOM ACCESS MEMORY IN RESPONSE TO TEMPERATURE, PROGRAMMABLE TEMPERATURE SENSING CIRCUIT AND MEMORY INTEGRATED CIRCUIT | Christopher B. Cooper, Ming-Bo Liu, Chris G. Martin, Troy A. Manning, Stephen L. Casper +3 more | 2004-08-17 |
| 6615391 | Current controlled multi-state parallel test for semiconductor device | Jackson Leung, Ronald J. Syzdek, Pow Cheah Chang | 2003-09-02 |
| 6552945 | METHOD FOR STORING A TEMPERATURE THRESHOLD IN AN INTEGRATED CIRCUIT, METHOD FOR STORING A TEMPERATURE THRESHOLD IN A DYNAMIC RANDOM ACCESS MEMORY, METHOD OF MODIFYING DYNAMIC RANDOM ACCESS MEMORY OPERATION IN RESPONSE TO TEMPERATURE, PROGRAMMABLE TEMPERATURE SENSING CIRCUIT AND MEMORY INTEGRATED CIRCUIT | Christopher B. Cooper, Ming-Bo Liu, Chris G. Martin, Troy A. Manning, Stephen L. Casper +3 more | 2003-04-22 |
| 6408411 | Two pass multi-state parallel test for semiconductor device | Jackson Leung, Ronald J. Syzdek, Pow Cheah Chang | 2002-06-18 |
| 6381718 | Current controlled multi-state parallel test for semiconductor device | Jackson Leung, Ronald J. Syzdek, Pow Cheah Chang | 2002-04-30 |
| 6351427 | Stored write scheme for high speed/wide bandwidth memory devices | — | 2002-02-26 |
| 6314036 | Method and apparatus for efficiently testing RAMBUS memory devices | Christopher B. Cooper, Thanh K. Mai | 2001-11-06 |
| 6279035 | Optimizing flow detection and reducing control plane processing in a multi-protocol over ATM (MPOA) system | Jeanne Haney, James L. Mangin, Derek H. Pitcher, Kishore K. Seshadri | 2001-08-21 |
| 6233190 | Method of storing a temperature threshold in an integrated circuit, method of modifying operation of dynamic random access memory in response to temperature, programmable temperature sensing circuit and memory integrated circuit | Christopher B. Cooper, Ming-Bo Liu, Chris G. Martin, Troy A. Manning, Stephen L. Casper +3 more | 2001-05-15 |
| 6208570 | Redundancy test method for a semiconductor memory | David R. Brown | 2001-03-27 |
| 6144598 | Method and apparatus for efficiently testing rambus memory devices | Christopher B. Cooper, Thanh K. Mai | 2000-11-07 |
| 6111811 | High-speed synchronous output driver | Daniel B. Penney, Thanh K. Mai | 2000-08-29 |
| 6049241 | Clock skew circuit | Roger D. Norwood | 2000-04-11 |
| 6028811 | Architecture for high bandwidth wide I/O memory devices | — | 2000-02-22 |
| 6005430 | Clock skew circuit | David R. Brown | 1999-12-21 |
| 5910923 | Memory access circuits for test time reduction | David R. Brown, Daniel B. Penney, Roger D. Norwood | 1999-06-08 |
| 5557219 | Interface level programmability | Roger D. Norwood | 1996-09-17 |
| 5440248 | Power-saver differential input buffer | David R. Brown | 1995-08-08 |