Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8530247 | Control of implant pattern critical dimensions using STI step height offset | James D. Bernstein, Hongyu Yue, Howie Hui Yang, Mark Boehm | 2013-09-10 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8530247 | Control of implant pattern critical dimensions using STI step height offset | James D. Bernstein, Hongyu Yue, Howie Hui Yang, Mark Boehm | 2013-09-10 |