Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6035262 | Real time observation serial scan test architecture | Jeffery A. Sprouse, Eduardo M. Lipiansky, Javad Khakbaz, Michael A. Plum, Philip Manela +1 more | 2000-03-07 |
| 6029263 | Interconnect testing using non-compatible scan architectures | — | 2000-02-22 |
| 5951703 | System and method for performing improved pseudo-random testing of systems having multi driver buses | Jeffrey A. Sprouse | 1999-09-14 |
| 5694401 | Fault isolation using pseudo-random scan | — | 1997-12-02 |
| 5450455 | Method and apparatus for including the states of nonscannable parts in a scan chain | Stephen W. Hamilton, Cheng-Gang Kong | 1995-09-12 |