Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12283515 | Method and device to reduce epitaxial defects due to contact stress upon a semicondcutor wafer | Che-Fu Chiu, Bau-Ming Wang, Chun-Feng Nieh, Huicheng Chang, Yee-Chia Yeo | 2025-04-22 |
| 11978634 | Reduce well dopant loss in FinFETs through co-implantation | Chun-Feng Nieh, Huicheng Chang | 2024-05-07 |
| 11348792 | Reduce well dopant loss in FinFETs through co-implantation | Chun-Feng Nieh, Huicheng Chang | 2022-05-31 |
| 10930507 | Reduce well dopant loss in FinFETs through co-implantation | Chun-Feng Nieh, Huicheng Chang | 2021-02-23 |