SW

Siao-Shan Wang

TSMC: 15 patents #2,074 of 12,232Top 20%
📍 Tainan, TW: #419 of 4,566 inventorsTop 10%
Overall (All Time): #304,764 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
12211698 Method composition and methods thereof Cheng-Han Wu, Ching-Yu Chang, Chin-Hsiang Lin 2025-01-28
12135502 Resin, photoresist composition, and method of manufacturing semiconductor device Ching-Yu Chang, Chin-Hsiang Lin 2024-11-05
12085855 Resin, photoresist composition, and method of manufacturing semiconductor device Ching-Yu Chang, Chin-Hsiang Lin 2024-09-10
11387104 Grafting design for pattern post-treatment in semiconductor manufacturing Ching-Yu Chang, Chin-Hsiang Lin 2022-07-12
10915027 Post development treatment method and material for shrinking critical dimension of photoresist layer Ching-Yu Chang 2021-02-09
10866515 Lithography process using photoresist material with photosensitive functional group Ming-Hui Weng, Cheng-Han Wu, Ching-Yu Chang, Chin-Hsiang Lin 2020-12-15
10863630 Material composition and methods thereof Cheng-Han Wu, Ching-Yu Chang, Chin-Hsiang Lin 2020-12-08
10747114 Blocking layer material composition and methods thereof in semiconductor manufacturing Chen-Yu Liu, Ching-Yu Chang, Chin-Hsiang Lin 2020-08-18
10672619 Material composition and methods thereof Cheng-Han Wu, Ching-Yu Chang, Chin-Hsiang Lin 2020-06-02
10672610 Grafting design for pattern post-treatment in semiconductor manufacturing Ching-Yu Chang, Chin-Hsiang Lin 2020-06-02
10517179 Material composition and methods thereof Cheng-Han Wu, Ching-Yu Chang, Chin-Hsiang Lin 2019-12-24
10394123 Blocking layer material composition and methods thereof in semiconductor manufacturing Chen-Yu Liu, Ching-Yu Chang, Chin-Hsiang Lin 2019-08-27
10114291 Grafting agent for forming spacer layer Ya-Ling Cheng, Ching-Yu Chang, Chien-Chih Chen, Chun-Kuang Chen, Wei-Liang Lin 2018-10-30
10036957 Post development treatment method and material for shrinking critical dimension of photoresist layer Ching-Yu Chang 2018-07-31
9810990 Chemical treatment for lithography improvement in a negative tone development process Wei-Han Lai, Ching-Yu Chang, Cheng-Han Wu, Chin-Hsiang Lin 2017-11-07