Issued Patents All Time
Showing 51–75 of 75 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11450663 | Semiconductor device structure and methods of forming the same | Zhi-Chang Lin, Jung-Hung Chang, Lo-Heng Chang, Chien Ning Yao, Kuo-Cheng Chiang +1 more | 2022-09-20 |
| 11430892 | Inner spacers for gate-all-around transistors | Kuo-Cheng Chiang, Zhi-Chang Lin, Chih-Hao Wang, Pei-Hsun Wang, Lo-Heng Chang +1 more | 2022-08-30 |
| 11398550 | Semiconductor device with facet S/D feature and methods of forming the same | Zhi-Chang Lin, Jung-Hung Chang, Lo-Heng Chang | 2022-07-26 |
| 11380768 | Semiconductor device and manufacturing method thereof | Chun-Hsiung Lin, Chih-Hao Wang | 2022-07-05 |
| 11321958 | Electronic device and fingerprint sensing control method thereof | Cho-Hsuan Jhang, Su-Wei Lien, Chih-Peng Hsia, Shiang-Fei Wang | 2022-05-03 |
| 11315925 | Uniform gate width for nanostructure devices | Jui-Chien Huang, Chih-Hao Wang, Kuo-Cheng Chiang, Zhi-Chang Lin, Jung-Hung Chang +3 more | 2022-04-26 |
| 11309424 | Semiconductor device and manufacturing method thereof | Zhi-Chang Lin, Jung-Hung Chang, Lo-Heng Chang, Chien Ning Yao | 2022-04-19 |
| 11309187 | Methods of forming silicide contact in field-effect transistors | Chun-Hsiung Lin, Chih-Hao Wang, Jung-Hung Chang, Jui-Chien Huang | 2022-04-19 |
| 11264502 | Semiconductor device and method | Jung-Hung Chang, Lo-Heng Chang, Zhi-Chang Lin, Kuo-Cheng Chiang, Chih-Hao Wang | 2022-03-01 |
| 11245036 | Latch-up prevention | Kuo-Cheng Chiang, Zhi-Chang Lin | 2022-02-08 |
| 11211472 | Semiconductor device and method of forming the same | Pei-Hsun Wang, Kuo-Cheng Chiang, Chih-Hao Wang | 2021-12-28 |
| 11171091 | Semiconductor device having contact plug connected to gate structure on PMOS region | Li-Hsuan Ho, Tsuo-Wen Lu, Shih-Hao Liang, Tsung-Hsun Wu, Po-Jen Chuang +1 more | 2021-11-09 |
| 11139379 | Semiconductor structure and method for forming the same | Zhi-Chang Lin, Kuo-Cheng Chiang, Pei-Hsun Wang, Chih-Hao Wang | 2021-10-05 |
| 11093080 | Electronic device and fingerprint sensing control method thereof | Cho-Hsuan Jhang, Chih-Peng Hsia, Shiang-Fei Wang, Su-Wei Lien | 2021-08-17 |
| 11087988 | Semiconductor device structure with silicide and method for forming the same | Chun-Hsiung Lin, Jung-Hung Chang, Kuo-Cheng Chiang, Chih-Hao Wang | 2021-08-10 |
| 11049774 | Hybrid source drain regions formed based on same Fin and methods forming same | Pei-Hsun Wang, Chun-Hsiung Lin, Chih-Hao Wang | 2021-06-29 |
| 10944009 | Methods of fabricating a FinFET device with wrap-around silicide source/drain structure | Pei-Hsun Wang, Chih-Chao Chou, Jung-Hung Chang, Jui-Chien Huang, Chun-Hsiung Lin +1 more | 2021-03-09 |
| 10847373 | Methods of forming silicide contact in field-effect transistors | Chun-Hsiung Lin, Chih-Hao Wang, Jung-Hung Chang, Jui-Chien Huang | 2020-11-24 |
| 10748775 | Semiconductor device structure with silicide and method for forming the same | Chun-Hsiung Lin, Jung-Hung Chang, Kuo-Cheng Chiang, Chih-Hao Wang | 2020-08-18 |
| 10204788 | Method of forming high dielectric constant dielectric layer by atomic layer deposition | Shan Ye, Tsuo-Wen Lu, Tzu-Hsiang Su, Po-Jen Chuang | 2019-02-12 |
| 9881922 | Semiconductor device and method | Hong-Lin Chen, Ming-Shan Shieh, Chin-Chi Wang, Wai-Yi Lien, Chih-Hao Wang | 2018-01-30 |
| 9871136 | Semiconductor device | Tsai-Yu Wen, Shan Ye, Tsuo-Wen Lu | 2018-01-16 |
| 9711326 | Test structure for electron beam inspection and method for defect determination using electron beam inspection | Kuan-Chun Lin, Chih-Chieh Chou, Chung-Chih Hung, Yung-Teng Tsai, Chi-Hung Chan | 2017-07-18 |
| 9431517 | Semiconductor device and method | Hong-Lin Chen, Ming-Shan Shieh, Chin-Chi Wang, Wai-Yi Lien, Chih-Hao Wang | 2016-08-30 |
| 9330902 | Method for forming HfOx film based on atomic layer deposition (ALD) process | Tsai-Yu Wen, Shan Ye, Tsuo-Wen Lu, Yu-Ren Wang | 2016-05-03 |