Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11387363 | Source/drain junction formation | Chun Hsiung Tsai, Ziwei Fang | 2022-07-12 |
| 10720529 | Source/drain junction formation | Chun Hsiung Tsai, Ziwei Fang | 2020-07-21 |
| 10158019 | Source/drain junction formation | Chun Hsiung Tsai, Ziwei Fang | 2018-12-18 |
| 10134896 | Cyclic deposition etch chemical vapor deposition epitaxy to reduce EPI abnormality | Chun Hsiung Tsai, Ying-Min Chou, Yi-Fang Pai | 2018-11-20 |
| 9953878 | Method of forming a semiconductor device | Yu-Lien Huang, Tung Ying Lee, Pei-Yi Lin, Chun-Hsiang Fan, Neng-Kuo Chen +1 more | 2018-04-24 |
| 9722083 | Source/drain junction formation | Chun Hsiung Tsai, Ziwei Fang | 2017-08-01 |
| 9482518 | Systems and methods for semiconductor device process determination using reflectivity measurement | Chun Hsiung Tsai, De-Wei Yu | 2016-11-01 |
| 9257323 | Semiconductor device and method for forming the same | Yu-Lien Huang, Tung Ying Lee, Pei-Yi Lin, Chun-Hsiang Fan, Neng-Kuo Chen +1 more | 2016-02-09 |
| 8927359 | Multi-composition dielectric for semiconductor device | Su-Hao Liu, Chun-Yi Chang, Ming-Feng Lin, Ziwei Fang | 2015-01-06 |
| 8883522 | System for semiconductor device characterization using reflectivity measurement | Chun Hsiung Tsai, De-Wei Yu | 2014-11-11 |
| 8753904 | Method and system for semiconductor device pattern loading effect characterization | Chun Hsiung Tsai, De-Wei Yu | 2014-06-17 |