Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9891273 | Test structures and testing methods for semiconductor devices | Yung-Hsin Kuo, Wensen Hung | 2018-02-13 |
| 9417263 | Testing probe head for wafer level testing, and test probe card | Yung-Hsin Kuo, Wensen Hung | 2016-08-16 |
| 8832933 | Method of fabricating a semiconductor test probe head | Yung-Hsin Kuo, Wensen Hung | 2014-09-16 |