Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7383259 | Method and system for merging wafer test results | Keng-Chia Yang, Chiu Wen Jen, Chung-Yu Chang | 2008-06-03 |
| 7035770 | Fuzzy reasoning model for semiconductor process fault detection using wafer acceptance test data | Shuo-Huei Lin, Ruenn-Sheng Peng, Yi-Ju Chen | 2006-04-25 |