Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7587293 | Semiconductor CP (circuit probe) test management system and method | Chih-Chien Chang, Yi-Sheng Huang, Ben Shin | 2009-09-08 |
| 7383259 | Method and system for merging wafer test results | Chiu Wen Jen, Chung-Yu Chang, Kuo-Rung Hsiao | 2008-06-03 |
| 7123040 | System and method for check-in control in wafer testing | Chih Chien Chen, Let-Long Chen | 2006-10-17 |
| 6470231 | Method and system for auto dispatching wafer | Yo-Huang Chang, Chen-Lung Chu, Yi-Hung Lee | 2002-10-22 |