Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7035770 | Fuzzy reasoning model for semiconductor process fault detection using wafer acceptance test data | Shuo-Huei Lin, Yi-Ju Chen, Kuo-Rung Hsiao | 2006-04-25 |
RP
Ruenn-Sheng Peng
Overall (All Time): #3,414,869 of 4,157,543Top 85%
1
Patents All Time