KT

Kuo-Chi Tu

TSMC: 189 patents #85 of 12,232Top 1%
VS Vanguard International Semiconductor: 1 patents #340 of 585Top 60%
📍 Jinshanmian, TW: #4 of 466 inventorsTop 1%
Overall (All Time): #3,754 of 4,157,543Top 1%
190
Patents All Time

Issued Patents All Time

Showing 151–175 of 190 patents

Patent #TitleCo-InventorsDate
7851861 MIM capacitor and metal gate transistor 2010-12-14
7745865 Devices and methods for preventing capacitor leakage 2010-06-29
7666737 Method of forming a metal-insulator-metal capacitor 2010-02-23
7557399 Metal-insulator-metal capacitors Wai-Yi Lien 2009-07-07
7382012 Reducing parasitic capacitance of MIM capacitor in integrated circuits by reducing effective dielectric constant of dielectric layer Chun-Yao Chen, Yi-Ching Lin 2008-06-03
7381613 Self-aligned MIM capacitor process for embedded DRAM 2008-06-03
7355240 Semiconductor product including logic, non-volatile memory and volatile memory devices and method for fabrication thereof Hsiang-Fan Lee 2008-04-08
7329953 Structure for reducing leakage currents and high contact resistance for embedded memory and method for making same 2008-02-12
7282757 MIM capacitor structure and method of manufacture Chun-Yao Chen, Shou-Gwo Wuu, Chen-Jong Wang 2007-10-16
7271083 One-transistor random access memory technology compatible with metal gate process Kuo-Chyuan Tzeng, Chung-Yi Chen, C. Y. Shen, Chun-Yao Chen, Hsiang-Fan Lee 2007-09-18
7262090 Random access memory (RAM) capacitor in shallow trench isolation with improved electrical isolation to overlying gate electrodes 2007-08-28
7199423 Non-volatile memory technology compatible with 1T-RAM process 2007-04-03
7195970 Metal-insulator-metal capacitors Wai-Yi Lien 2007-03-27
7189613 Method and structure for metal-insulator-metal capacitor based memory device 2007-03-13
7163853 Method of manufacturing a capacitor and a metal gate on a semiconductor device 2007-01-16
7115935 Embedded DRAM for metal-insulator-metal (MIM) capacitor structure Chun-Yao Chen, Huey-Chi Chu 2006-10-03
7071509 Method of improving the top plate electrode stress inducting voids for 1T-RAM process 2006-07-04
7030444 Space process to prevent the reverse tunneling in split gate flash Wen-Ting Chu, Yi-Shing Chang, Yi-Jiun Lin 2006-04-18
7029968 Method of forming a PIP capacitor 2006-04-18
7019348 Embedded semiconductor product with dual depth isolation regions 2006-03-28
6949785 Random access memory (RAM) capacitor in shallow trench isolation with improved electrical isolation to overlying gate electrodes 2005-09-27
6902975 Non-volatile memory technology compatible with 1T-RAM process 2005-06-07
6872622 Method of forming a capacitor top plate structure to increase capacitance and to improve top plate to bit line overlay margin 2005-03-29
6867129 Method of improving the top plate electrode stress inducting voids for 1T-RAM process 2005-03-15
6853024 Self-aligned MIM capacitor process for embedded DRAM 2005-02-08