Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9753895 | Method for process variation analysis of an integrated circuit | Chin-Cheng Kuo, Wei Hu, Wei Min Chan, Jui-Feng Kuan | 2017-09-05 |
| 9519735 | Method of failure analysis | Chin-Cheng Kuo, Wei Hu, Wei Min Chan, Jui-Feng Kuan | 2016-12-13 |