Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387984 | Test structure and integrated circuit test using same | Wei-Kuan Yen, Yi-Cheng Chiu, Yen-Chiang Liu, Jui-Chun Weng | 2025-08-12 |
| 10866276 | Method and system for aligning probe card in semiconductor device testing | Kai-Di Chuang, Tien-Chung Lee, Chiu-Hua Chung | 2020-12-15 |
| 10509071 | Method and system for aligning probe card in semiconductor device testing | Kai-Di Chuang, Tien-Chung Lee, Chiu-Hua Chung | 2019-12-17 |