Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387984 | Test structure and integrated circuit test using same | Yi-Cheng Chiu, Yen-Chiang Liu, Kang-Tai Peng, Jui-Chun Weng | 2025-08-12 |
WY
Wei-Kuan Yen
Overall (All Time): #2,446,718 of 4,157,543Top 60%
1
Patents All Time