Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11828800 | Method of preparing a semiconductor specimen for failure analysis | CHI-LUN LIU, Shihhsin Chang | 2023-11-28 |
| 11604153 | Method of preparing a sample for physical analysis | CHI-LUN LIU, BANG-HAO HUANG, Yu-Han Chen | 2023-03-14 |
| 11468556 | Artificial intelligence identified measuring method for a semiconductor image | CHI-LUN LIU, BANG-HAO HUANG, Chao Chen | 2022-10-11 |
| 7550336 | Method for fabricating an NMOS transistor | Tsai-Fu Hsiao, Po-Yuan Chen | 2009-06-23 |
| 6905890 | Poly gate silicide inspection by back end etching and by enhanced gas etching | Cheng-Han Lee | 2005-06-14 |
| 6482748 | Poly gate silicide inspection by back end etching | Cheng-Han Lee | 2002-11-19 |