Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11828800 | Method of preparing a semiconductor specimen for failure analysis | Jung-Chin Chen, Shihhsin Chang | 2023-11-28 |
| 11619650 | Method of preparing a specimen for scanning capacitance microscopy | Hui HUANG, Chia-Ling Chen, Shihhsin Chang | 2023-04-04 |
| 11604153 | Method of preparing a sample for physical analysis | Jung-Chin Chen, BANG-HAO HUANG, Yu-Han Chen | 2023-03-14 |
| 11468556 | Artificial intelligence identified measuring method for a semiconductor image | Jung-Chin Chen, BANG-HAO HUANG, Chao Chen | 2022-10-11 |