Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11828800 | Method of preparing a semiconductor specimen for failure analysis | CHI-LUN LIU, Jung-Chin Chen | 2023-11-28 |
| 11619650 | Method of preparing a specimen for scanning capacitance microscopy | CHI-LUN LIU, Hui HUANG, Chia-Ling Chen | 2023-04-04 |