Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10605855 | Method, test line and system for detecting semiconductor wafer defects | Jing-Sen Wang, Yuan-Yao Chang, Chia-Wei Huang | 2020-03-31 |
HC
Hung-Chi Chiu
Overall (All Time): #2,783,287 of 4,157,543Top 70%
1
Patents All Time