Issued Patents All Time
Showing 26–28 of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7378720 | Integrated stress relief pattern and registration structure | Huang-Sheng Lin, Yu-Chyi Harn, Hsien-Wei Chen | 2008-05-27 |
| 7356787 | Alternative methodology for defect simulation and system | Jui-Jung Yan, Ricky Yang | 2008-04-08 |
| 7202550 | Integrated stress relief pattern and registration structure | Huang-Sheng Lin, Yu-Chyi Harn, Hsien-Wei Chen | 2007-04-10 |