CC

Chi-Wei Chang

TSMC: 6 patents #3,824 of 12,232Top 35%
IT ITRI: 2 patents #3,461 of 9,619Top 40%
Foxconn: 1 patents #3,106 of 5,504Top 60%
AO Au Optronics: 1 patents #1,836 of 2,945Top 65%
University of California: 1 patents #8,022 of 18,278Top 45%
TE Toong In Electronic: 1 patents #2 of 5Top 40%
YO Young Optics: 1 patents #104 of 188Top 60%
📍 Baoshan, CA: #24 of 69 inventorsTop 35%
Overall (All Time): #376,672 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
11042982 Ultra-dense electrode-based brain imaging system Wentai Liu, Ying Li, Jing Qin, Yi-Kai Lo 2021-06-22
10515813 Mechanisms for etching apparatus and etching-detection method Ping Fan 2019-12-24
10057674 Headphone system capable of adjusting equalizer gains automatically Teng-Sung Tseng 2018-08-21
9658316 Device and method for positioning and calibrating a wafer transportation apparatus Woo-Guan Chiong 2017-05-23
9373300 Power management method and power management device Feng-Ming Hsu, Szu-Che Yeh 2016-06-21
8292440 Projection module and adjustment mechanism thereof Wei-Szu Lin, Hsu-Chun Cheng 2012-10-23
8054376 Image sensor holder Heng Huang 2011-11-08
7584736 Lubrication device of four-stroke engines Shao-Yu Li, Yeu-Jou Lin, Huan-Lung Gu 2009-09-08
7481197 Lubrication device of four-stroke engines Shao-Yu Li, Yeu-Jou Lin, Huan-Lung Gu 2009-01-27
6627527 Method to reduce metal silicide void formation Maureen Wang, Winston Shue 2003-09-30
6542839 Apparatus and method for calibrating the position of a cassette indexer Hsueh-Chin Lu, Jeng-Ding Tseng 2003-04-01
6422610 Deformable fluid supply line 2002-07-23
6062084 Apparatus for detecting wafer edge defects and method of using Chung-Yi Lee 2000-05-16