Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11624985 | Methods of defect inspection | Ta-Ching Yu, Shih-Che Wang, Shu-Hao Chang, Yi-Hao Chen, Te-Chih Huang +1 more | 2023-04-11 |
| 10795270 | Methods of defect inspection | Ta-Ching Yu, Shih-Che Wang, Shu-Hao Chang, Yi-Hao Chen, Te-Chih Huang +1 more | 2020-10-06 |