Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10605863 | Mapping physical shift failures to scan cells for detecting physical faults in integrated circuits | Parthajit Bhattacharya, Rohit Kapur | 2020-03-31 |
| 9568550 | Identifying failure indicating scan test cells of a circuit-under-test | Parthajit Bhattacharya, Rohit Kapur | 2017-02-14 |