Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8108728 | Method and apparatus for operational-level functional and degradation fault analysis | Dipankar Das, Purnendu Sinha | 2012-01-31 |
| 7797123 | Method and apparatus for extracting assume properties from a constrained random test-bench | Kaushik De, Eduard Cerny, Pallab Dasgupta, Bhaskar Pal | 2010-09-14 |