Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11237210 | Layout-aware test pattern generation and fault detection | Alodeep Sanyal, Rohit Kapur, Salvatore Talluto | 2022-02-01 |
| 10254343 | Layout-aware test pattern generation and fault detection | Alodeep Sanyal, Rohit Kapur, Salvatore Talluto | 2019-04-09 |