Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7797601 | Slack-based transition-fault testing | Rohit Kapur, Tom W. Williams | 2010-09-14 |
| 7546500 | Slack-based transition-fault testing | Rohit Kapur, Tom W. Williams | 2009-06-09 |
| 6269463 | Method and system for automatically determining transparency behavior of non-scan cells for combinational automatic test pattern generation | Suryanarayana Duggirala, Harihara Ganesan | 2001-07-31 |