Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6351834 | Apparatus for testing semiconductor device | Junichi Hirase | 2002-02-26 |
| 5901154 | Method for producing test program for semiconductor device | Masayuki Motohama, Junichi Hirase, Akihiko Watanabe | 1999-05-04 |