Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7565582 | Circuit for testing the AC timing of an external input/output terminal of a semiconductor integrated circuit | Tomomitsu Masuda, Hiroshi Sonobe, Keisuke Kodera | 2009-07-21 |
| 5901154 | Method for producing test program for semiconductor device | Junichi Hirase, Akihiko Watanabe, Michio Maekawa | 1999-05-04 |
| 5894424 | Semiconductor testing apparatus | Junichi Hirase | 1999-04-13 |