Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6351834 | Apparatus for testing semiconductor device | Michio Maekawa | 2002-02-26 |
| 5901154 | Method for producing test program for semiconductor device | Masayuki Motohama, Akihiko Watanabe, Michio Maekawa | 1999-05-04 |
| 5894424 | Semiconductor testing apparatus | Masayuki Motohama | 1999-04-13 |