Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11917024 | Control system, support apparatus, and program for support apparatus | Norihiro MAEKAWA | 2024-02-27 |
| 11536480 | Air conditioner, sensor system, and thermal sensation estimation method | Shinichi Shikii, Koichi Kusukame | 2022-12-27 |
| 10843525 | Method for estimating thermal sensation, thermal sensation estimation apparatus, air conditioner, and recording medium | Aki Yoneda, Koichi Kusukame | 2020-11-24 |
| 10715396 | Support apparatus, non-transitory computer readable recording medium and setting method | Akio KAWAHARADA, Nobuyuki Takuma, Hiromu Suganuma, Ryosuke FUJIMURA | 2020-07-14 |
| 10528017 | Information processing apparatus, information processing method, and computer readable storage medium | Ryosuke FUJIMURA, Nobuyuki Takuma, Hiromu Suganuma, Asahi Matsui | 2020-01-07 |
| 10486491 | Method for estimating thermal sensation, thermal sensation estimation apparatus, air conditioner, and recording medium | Aki Yoneda, Koichi Kusukame | 2019-11-26 |
| 10266033 | Method for estimating thermal sensation, thermal sensation estimation apparatus, air conditioner, and recording medium | Aki Yoneda, Koichi Kusukame | 2019-04-23 |
| 6969870 | Semiconductor device having an amorphous silicon-germanium gate electrode | Kenji Yoneda | 2005-11-29 |
| 6861375 | Method of fabricating semiconductor device | Hiroaki Nakaoka, Atsushi Ishinaga | 2005-03-01 |
| 6710382 | Semiconductor device and method for fabricating the same | Kenji Yoneda | 2004-03-23 |
| 6633047 | Apparatus and method for introducing impurity | Masahiko Niwayama, Kenji Yoneda | 2003-10-14 |
| 6589827 | Semiconductor device and method for fabricating the same | Kenji Yoneda | 2003-07-08 |
| 6451674 | Method for introducing impurity into a semiconductor substrate without negative charge buildup phenomenon | Masahiko Niwayama, Kenji Yoneda | 2002-09-17 |
| 6147749 | Method and apparatus for measuring concentration by light projection | Yoshio Mitsumura, Harumi Uenoyama, Kexin Xu | 2000-11-14 |
| 5772606 | Method of and apparatus for measuring uric components | Emi Ashibe, Takeshi Sakura, Harumi Uenoyama, Xu Kexin | 1998-06-30 |
| 5696580 | Method of and apparatus for measuring absorbance, component concentration or specific gravity of liquid sample | Xu Kexin, Harumi Uenoyama | 1997-12-09 |
| 5615009 | Method of stabilizing spectra in spectrometry | Takeshi Sakura, Yutaka Yamasaki, Kexin Xu, Motonobu Shiomi | 1997-03-25 |