FS

Frederic Anthony Schraub

ST Strasbaugh: 1 patents #26 of 32Top 85%
Overall (All Time): #3,173,011 of 4,157,543Top 80%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8520222 System and method for in situ monitoring of top wafer thickness in a stack of wafers Michael Vogtmann, Benjamin C. Smedley 2013-08-27