| 8977513 |
Reliability test with monitoring of the results |
Carolina Selva |
2015-03-10 |
| 8161327 |
Process and system for the verification of correct functioning of an on-chip memory |
Carolina Selva, Danilo Rimondi, Rita Zappa |
2012-04-17 |
| 7571367 |
Built-in self diagnosis device for a random access memory and method of diagnosing a random access |
Carolina Selva, Rita Zappa, Danilo Rimondi, Giovanni Mastrodomenico |
2009-08-04 |
| 7284166 |
Programmable multi-mode built-in self-test and self-repair structure for embedded memory arrays |
Rita Zappa, Carolina Selva, Danilo Rimondi |
2007-10-16 |
| 6963499 |
Static RAM with flash-clear function |
Danilo Rimondi |
2005-11-08 |
| 6624471 |
Lateral DMOS transistor with first and second drain electrodes in respective contact with high-and low-concentration portions of a drain region |
Nicola Zatelli, Massimo Atti, Elisabetta Palumbo |
2003-09-23 |
| 6061286 |
Memory device with reduced power dissipation |
Andrea Baroni, Danilo Rimondi, Michele Taliercio |
2000-05-09 |
| 5818775 |
Static ram with reduced power consumption |
Danilo Rimondi |
1998-10-06 |