Issued Patents All Time
Showing 26–36 of 36 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7560939 | Electrical defect detection using pre-charge and sense scanning with prescribed delays | Indranil De, Kurt H. Weiner | 2009-07-14 |
| 6893749 | SiC-formed material | Takaomi Sugihara, Tomonori Tahara, Akihiro Kuroyanagi | 2005-05-17 |
| 6853941 | Open-loop for waveform acquisition | Hui Wang, Hiroyasu Koike | 2005-02-08 |
| 6566897 | Voltage contrast method and apparatus for semiconductor inspection using low voltage particle beam | Chiwoei Wayne Lo | 2003-05-20 |
| 6344750 | Voltage contrast method for semiconductor inspection using low voltage particle beam | Chiwoei Wayne Lo | 2002-02-05 |
| 5993770 | Silicon carbide fabrication | Akihiro Kuroyanagi, Tomiya Yasunaka, Yuji Ushijima | 1999-11-30 |
| 5638005 | Predictive waveform acquisition | Suresh Rajan | 1997-06-10 |
| 5078243 | One-way clutch | Hidetaka Nakano | 1992-01-07 |
| 4995490 | Roller-synchronized one-way clutch assembly | — | 1991-02-26 |
| 4786869 | Toner level sensor | Osamu Shimoe | 1988-11-22 |
| 4592645 | Apparatus for controlling concentration of toner in developer | Osamu Shimoe, Sadaji Tashiro | 1986-06-03 |