Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10429436 | Method, device and system for measuring an electrical characteristic of a substrate | Jean-Pierre Raskin, Eric Desbonnets | 2019-10-01 |
| 10163682 | Methods of forming semiconductor structures | Ludovic Ecarnot, Damien Parissi | 2018-12-25 |