Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12216044 | System for measuring thickness and physical properties of thin film using spatial light modulator | Seung Woo Lee, Min Gyu Kim | 2025-02-04 |
| 9696144 | Three-dimensional shape measuring device capable of measuring color information | Tae-Yong Jo, Young-Min Hwang, Seong Ryong Kim, Sang Soo Kang | 2017-07-04 |
| 8947673 | Estimating thickness based on number of peaks between two peaks in scanning white light interferometry | Woo Jung Ahn, Seong Ryong Kim, Jun Hyeok Lee | 2015-02-03 |
| 8873067 | Interferometer for TSV measurement and measurement method using same | Ki Hun LEE, Heung Hyun Shin | 2014-10-28 |
| 8279447 | Method for measuring thickness | Young-Min Hwang, Woo Jung Ahn | 2012-10-02 |
| 8199332 | Apparatus for measuring thickness | Woo Jung Ahn, Young-Min Hwang, Chang Yeol Lee, Ji Won Choi | 2012-06-12 |
| 7308130 | Method for inspecting input shaft of power steering system | Moon-Tae Hwang, Jin-Ki Kim | 2007-12-11 |
| 7243571 | Ultra-precision positioning system | Jong-Ho Park | 2007-07-17 |
| 7113273 | Machine and method for inspecting ferrule of optical connector | Il-Hwan Lee, Hwa-Kyun Lee, Dong-Sung Lee | 2006-09-26 |
| 6860020 | Ultra-precision feeding apparatus | Jong-Ho Park | 2005-03-01 |
| 6269544 | Apparatus for measuring three-dimensional volumetric errors in multiaxis machine tool | Young-Sam Kim | 2001-08-07 |
| 6167634 | Measurement and compensation system for thermal errors in machine tools | Suk Won Lee | 2001-01-02 |
| 6005669 | Non contact measuring method for three dimensional micro pattern in measuring object | Sung Wook Cho, Woo Jung Ahn | 1999-12-21 |
| 5841668 | Method of assessing three dimensional volumetric errors in multiaxis machine tools | Joon Hee Moon, Chong Nam Chu | 1998-11-24 |