Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12159681 | Test systems configured to perform test mode operations for multiple memory devices | Sang-Ah Hyun, Yong Ho Seo, Jun-Phyo Lee, Bong-Hwa Jeong | 2024-12-03 |
| 10060969 | Test board unit and apparatus for testing a semiconductor chip including the same | Byoung Seon Koh, Hyo Jin Oh, Young-Bae Choi, Jin Young Jung | 2018-08-28 |
| 9714977 | Burn-in test system and method | Dae Kyoung KIM | 2017-07-25 |
| 9418760 | Integrated circuit and method for testing semiconductor devices using the same | Weon-Seon Lee, O-Han Kwon, In Tae Kim | 2016-08-16 |
| 9047806 | Display device and method of adjusting viewing angle thereof | Dong-hyun Lim, Dong-Hyun Ham, Seong Hwan Kim | 2015-06-02 |
| 8340947 | Single quantification method of external event PSA model containing multi-compartment propagation scenarios | Kil Yoo Kim, Yoon Hwan Lee, Joon Eon Yang, Mee Jeong Hwang | 2012-12-25 |