Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9418760 | Integrated circuit and method for testing semiconductor devices using the same | Woo Sik Jung, O-Han Kwon, In Tae Kim | 2016-08-16 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9418760 | Integrated circuit and method for testing semiconductor devices using the same | Woo Sik Jung, O-Han Kwon, In Tae Kim | 2016-08-16 |