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Test systems configured to perform test mode operations for multiple memory devices |
Sang-Ah Hyun, Yong Ho Seo, Woo Sik Jung, Bong-Hwa Jeong |
2024-12-03 |
| 11367467 |
Semiconductor device with memory banks and sense amplifier arrays |
Hyung Sik Won, Seung Han OAK |
2022-06-21 |
| 10762930 |
Semiconductor device with memory banks and sense amplifier arrays |
Hyung Sik Won, Seung Han OAK |
2020-09-01 |
| 9911706 |
Semiconductor device |
Chang-Hyun Cho, Yong Hwan Jeong |
2018-03-06 |
| 8395953 |
Bit-line sense amplifier, semiconductor memory device having the same, and method of testing bit-line micro-bridge defect |
Cheol Joong Kim, Sang-Kyun Park, Jung-Bae Lee |
2013-03-12 |
| 8379477 |
Sub-word-line driving circuit, semiconductor memory device having the same, and method of controlling the same |
Cheol Joong Kim, Sang-Kyun Park, Jung-Bae Lee |
2013-02-19 |
| 8125846 |
Internal voltage generating circuit of semiconductor memory device |
— |
2012-02-28 |
| 7973526 |
Reference voltage generator having improved setup voltage characteristics and method of controlling the same |
— |
2011-07-05 |
| 7750729 |
Internal voltage generator |
Young Gu Kang, Beob-Rae Cho |
2010-07-06 |
